Philips Advanced Metrology Systems
Taking on the Market Leader
The Challenge:
In June 2003, LP&P entered into a relationship with Philips Advanced Metrology Systems (Philips AMS), the metrology business unit of Royal Philips Electronics. Philips AMS’s solutions enable semiconductor companies to better measure copper interconnects and associated materials such as low-k dielectrics. Prior to the relationship with LP&P, Philips AMS had received very little press coverage in a market where there were established market giants. After a company rebranding, Philips AMS wanted to establish itself as an emerging leader in the thin-film copper metrology market. The semiconductor industry is evolving away from aluminum to copper and low-k materials, smaller line widths and decreased node size. As the industry shifts, the company needs to be positioned as the metrology solution of choice for the future.
The LP&P Difference:
LP&P leveraged an upcoming industry tradeshow, Semicon West 2003, as the vehicle to launch Philips AMS. LP&P recommended the development of a white paper to help communicate the market issues and product differentiators between Philips AMS approach to copper metrology and its established competitors. Leveraging this white paper along with two new product announcements, LP&P aggressively outreached to key target media and analysts who were planning to attend the event. These meetings helped to build relationships with the editors and reporters who cover the company’s space as well as secure coverage for that fall.
LP&P maintained the momentum that began at Semicon West 2003 by developing a targeted news calendar that leveraged joint research papers, applications and international distributor announcements. Working closely with Philips AMS, LP&P learned that they were going to be unveiling a technology paper at a forthcoming conference that outlined a technique for measuring low-k. LP&P identified this as a major announcement and positioned it as such with analyst and media.
The Results:
Building on the relationships it had built at Semicon West, LP&P secured coverage in the company’s top tier target publications and with key industry analysts. Coverage included:
- Semiconductor Reporter: “Philips AMS, IMEC, and JSR Develop Method for Dielectric Stiffness Measurement,” September 22, 2003
- Electronic News: “Increased Yields Possible from Philips AMS Low-k Advance,” September 22, 2003
- Semiconductor International: “Increased Yields Possible from Philips AMS Low-k Advance,” September 22, 2003
- Silicon Strategies: “Philips' Metrology Unit Claims Breakthrough in Low-k,” September 22, 2003
- EE Times: “Philips AMS Targets Low-k Metrology,” September 22, 2003
- Semico Spin: “Philips AMS Announces New Metal, Low-k Dielectric Metrology Tool,” September 24, 2003
- InStat InfoAlert: “Philips Advanced Metrology Systems Extends Relationship with European Research Center IMEC And Announces Rapid, Non-Contact Technique for Measuring Low-k Dielectric Film Properties,” September 26, 2003
To further position Philips AMS as an emerging leader in the minds of key media, LP&P instituted a program to bring top editors on-site to the company to meet the company’s General Manager and see the product. Editors from Semiconductor International, Wafer News, Semiconductor Manufacturing and Solid State Technology all visited, resulting in numerous opportunities for contributed articles, bylines and inclusion in market reports.
One key goal of the program was to gain recognition from the market leader who to date had not mentioned them as a competitor. In November of 2003, months after the start of LP&P’s program the market leader acknowledged Philips AMS as an emerging competitor during their quarterly earnings call.
Client Quote:
“Lois Paul & Partners has raised our visibility and established us as a recognized emerging leader in our market. The powerful impact of their program is evidenced by the marked increase in both the quantity and quality of our customer contacts.”
-Bill Gately, GM, Philips Advanced Metrology Systems.